GENASYS Semiconductor test solutions deliver the performance, scalability and flexibility ideally suited for a wide range of digital and mixed-signal semiconductor applications including 5G mmWave, digital IC’s, and MOX Gas Sensor devices. The modular open system architecture simplifies system expansion and instrumentation upgrade activities, while significantly reducing cost of test and deployed footprint.

Delivering the highest production test speeds available, the TS-900e-5G mmWave semiconductor device test system supplies true independent, multi-port parallel production test performance to 53 GHz, including multi-site test capabilities. Gap-free, vector correlated VNA measurements ensure the highest quality RF test performance, while the receiver interface supports wafer probe and packaged device test, and delivers the system throughput required to meet OSAT demands.

Available software tools including: ATEasy for test development and execution, SemiEasy – an add on for semiconductor production, vector conversion from STIL, WGL, EVCD/VCD, and more.