Marvin Test Solutions’ GtDio6x-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD and ATP files to a Marvin Test Solutions’ digital instrument file format. GtDio6x-FIT works in conjunction with Marvin Test Solutions’ GtDio6x function library software which provides an efficient tool set for developing, debugging, and executing digital test vectors for MTS’ GX5296 and GX5960 series digital instruments.

The Standard Test Interface Language (STIL, IEEE-1450) was developed by a consortium of several test equipment vendors, computer aided engineering (CAE), computer aided design (CAD) and integrated circuit (IC) vendors. The standard provides a common language to transfer digital test data vectors from the design environment to the test environment.

The Waveform Generation Language (WGL), pronounced “wiggle”, is a data description language created by Test System Strategies Inc. (TSSI). A WGL file is essentially a text file that contains signal patterns along with timing, diagnostics and other information. The WGL vector formats are commonly used by engineers to test semiconductor devices during the design validation and production test phases of product development. These vectors are generated by electronic design automation (EDA) tools and are used to test a device and verify that its physical implementation matches the results achieved in simulation.

The VCD and EVCD file formats are part of the IEEE-1364 (IEEE Standard for Verilog® Hardware Description Language). Extended VCD (EVCD, IEEE-1364-2001) is a newer version of the VCD file format and supports directional data. The ATP file format is the digital test vector format used with Teradyne semiconductor test systems.

GtDio6x-FIT and the GtDio6x library provide the functionality for importing the above files and converting them to a DIO file format which can then be loaded into DIO cards. When importing a file, the software will analyze the input file and create an MTS digital file that is compatible with the GX5296’s or GX5960 series capabilities while preserving as close as possible, the input file’s functionality and timing. The generated DIO file supports both stimulus / response and real-time compare (RTC) modes of operation.

Applications

• Semiconductor test systems
• Digital test systems
• Mixed signal testers
• Digital emulation systems
• Hybrid & SoC Component Test