Overview

PEM42A allows the measurement of both PIM and S-parameters with a single DUT connection. Our PEM42A Analyzer can be equipped with one to four different RF Units. PEM42A Analyzer is well suited for R&D, production & QA

Both PIM and S-parameters, such as return loss or insertion loss, are essential measurements for passive components. Both must be tested in order to fully qualify a passive device. Conventional test systems require a network analyzer and separate PIM analyzers to test a device completely. If different test stations are used, the time required to connect and disconnect components can significantly exceed actual testing time.

PEM42A allows you to measure PIM and S-parameters with a single DUT connection. It utilizes the Agilent E5072A ENA series network analyzer to perform S-parameter measurements together with AWT’s PEM42A multi band PIM analyzers. Whether for R&D, production or QA , this system is well suited for testing wideband components.

Conventional PIM analyzers are designed for a specific frequency band. Testing wide band devices requires several PIM analyzers. PEM42A multi band systems combine up to four frequency bands to one unified system. All instruments are controlled by a PEM42ACTRL Control & Switch Master Unit for synchronized measurements. PEM42A systems are a cost-effective solution, providing very fast and accurate measurements. Repeated connect / disconnect cycles for measuring PIM of DUTs in different frequency bands is a thing of the past. Both PIM and S-parameters are now measured without changing the physical connection. This results in a major reduction of overall test time and increases test throughput significantly.