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MTEK Series | DCT | Test and Measurement

DCT | Test and Measurement

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MTEK Series

Semiconductor Test System Expansion / Upgrades

  • Capability enhancements / upgrades for current and legacy semiconductor test systems
  • PXI-based, cost-effective, open-architecture add-on solution
  • Compatible with legacy test platforms including Teradyne, LTX/Credence, and Verigy
  • Easily add performance: RF, digital, and analog capabilities
Send Enquiry

MTEK Series Specifications

MTEK Platform โ€“ Electrical and Mechanical
Mainframe
GX7610
9-slot, 3U PXI Express Chassis
  • Supports a 3U MXI controller, 2 PXI Express hybrid slots, 5 PXI slots, and a PXI Express system timing slot
  • Integral Smart functions provide per-slot temperature monitoring and system power supply voltage monitoring
  • Note: Requires (1) PCIe slot in host computer
Input AC Power
  • 115 VAC @ 10 A, 50 / 60 Hz, or
  • 230 VAC @ 5 A, 50 / 60 Hz
  • Autorange switching
Input Voltage Range 90 VAC to 264 VAC rms
Weight 22 lbs max., fully-populated
Size 4U (7โ€ณ H x 8.9โ€ณ W x 18โ€ณ D)
Analog / Digital Instrument Options
GX2065
6.5 Digital DMM/Digitizer
  • AC true RMS measurements: 10 Hz to 300 KHz
  • Voltage range: 1 ึฒยตV to 300 V
  • Resistance ranges: 100 ึพยฉ to 100 Mึพยฉ
  • Current ranges: 2mA to 2 A
GX5295
Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU
  • 32 input / output channels, dynamically configurable on a per-channel basis
  • 64 M of vector memory per channel
  • Drive / sense voltage range of -2 V to +7 V with PMU per pin
  • 100 MHz vector rate
  • Stimulus / Response and real-time Compare modes
GX1120
2-channel Arbitrary Waveform Function Generator
  • 250 MS/s sample rate
  • 16-bit vertical resolution
  • 32 M sample memory
  • PLL clock generator for AWG mode
GX2472 / GX2475
Dual Channel Digitizer
  • 70 MS/s 14-bit digitizer
  • Differential or single-ended inputs
  • 1 V to 20 Vpp full scale (GX2472)
  • 75 V to 600 Vpp full scale (GX2475)
GX3104
4-channel SMU
  • 4-quadrant operation: ึฒยฑ20 V, ึฒยฑ250 mA
  • 24-bit ADCโ€™s,18-bit DACโ€™s
  • 7 current ranges, ึฒยฑ250 nA to ึฒยฑ240 mA full scale
  • Up to 1 A capability for any one channel
RF Instrument Options
M9420A, M9421A
RF Vector Transceiver
  • 60 MHz to 6 GHz
  • 160 MHz analysis BW
M9381A
Vector Signal Generator
  • 1 MHz to 6 GHz
  • 160 MHz I-Q BW
M9393A, M9391A
RF Vector Signal Analyzer
  • 9 KHz to 50 GHz
  • 160 MHz analysis BW
  • Supports cellular and WLAN stds
M9370A Series
VNA
  • 300 KHz to 26.5 GHz
  • Two port VNA
  • Single PXI slot
M9830A
CW Signal Generator
  • 1 MHz to 6 GHz
Counter / Time Measurement Unit and Clock Generator Options
Counter / Time Measurement Unit
  • Measure jitter, frequency, time interval (skew), pulse width, risetime, event timing, time interval error (TIE)
  • DC to 500 MHz frequency range, 6 GHz prescaler option
  • 20 million continuous measurements / second
  • 2 ps single-shot resolution (13 digits/s frequency)
  • Single PXI slot
Clock Generator
  • DC to 4 GHz squarewaves
  • Differential or single-ended output
  • Ultra-low phase noise (0.3 ps jitter)
  • 20-digit resolution
  • Single PXI slot
Environmental
Operating Temperature 0 ึฒยฐC to +50 ึฒยฐC
Storage Temperature -20 ึฒยฐC to +60 ึฒยฐC
Relative Humidity
(Non-Condensing)
90%
Altitude 30,000 ft


Note: Specifications are subject to change without notice.

The MTEK (Marvin Test Expansion Kit) Series is a cost-effective, PXI-based test solution that offers modern instrumentation with advanced specifications โ€“ extending the life and capabilities of legacy ATE. Based on Marvin Test Solutionsโ€™ portfolio of PXI chassis and instrumentation, the MTEK Series can be readily integrated with a legacy ATE platform, providing advanced digital, analog or RF test capabilities. Based on the open architecture of PXI, the MTEK system offers a flexible and scalable solution which can be specifically configured to address a range of test needs for both packaged and wafer test applications. Designed to support both engineering and high volume production installations, the MTEK Series is the ideal low-cost solution for extending the life cycle of legacy semiconductor ATE systems.

FEATURES

The MTEK Series core platform includes a 9-slot, PXI Express chassis and a MXI interface which provides the control interface to the host ATE system.

8 peripheral slots are available for supporting PXI and PXI Express instrumentation. Availble PXI instrumentation offers analog and digital capabilities including:

  • 6.5 Digital DMM
  • Performance Digital I/O with PMU per pin
  • 200 MS/s AWG
  • 70 MS/s Digitizer
  • RF generator & analyzer
  • Time Measurement Unit (TMU)

The MTEKโ€™s compact form factor simplifies mechanical integration with the legacy test system and users have the option to interface the MTEKโ€™s resources via the DUTโ€™s load board or the testerโ€™s receiver interface.

SOFTWARE

The MTEK system is supplied with Windowsึฒยฎ compatible instrument drivers and virtual instrument panels, which provides interactive control and monitoring of the instruments from a window that displays the instrumentื’โ‚ฌโ„ขs current settings and status. In addition, digital instrumentation is supplied with graphical vector development / waveform display tools and as an option, a file import tool is available for importing and converting STIL, WGL, VCD, eVCD and ATP file formats.

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MTEK Series

Israel's Leading Businesses Choose DCT

Israel's Leading Businesses Choose DCT

DCTโ€™s Skilled Management Team has more than twenty-five years of experience and expertise in the local business environment, coupled with a highly motivated group of employees, positions us as the preferred supplier among the major customers in the industry.

DCT Competitive Edge is the prompt response to our customer needs, the online and on-site direct technical support, professional consulting for the best cost/performance solution, on-time delivery, long-term maintenance, and support.

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