- Measurement Frequency 100Hz-100kHz
- Output Voltage (ALC ON) AC 0.1-1Vrms
- Maximum Output Current 0.15A
- Output Impedance (ALC + BOX ON) 10Ω
- Output Impedance (ALC + BOX OFF) 25Ω/100Ω
- Tested Component Size ≤ 7mm
FX-LR0001 Automatic Level Compensation Fixture
- Measurement Frequency Covers a wide range from 100 Hz to 100 kHz for versatile signal testing.
- Adjustable Output Voltage Provides 0.1–1 Vrms AC output when ALC is enabled for precise amplitude control.
- Maximum Output Current Delivers up to 0.15 A, suitable for driving various components during testing.
- Output Impedance 10Ω with ALC + BOX ON; 25Ω/100Ω with ALC + BOX OFF for flexible impedance matching.
- Component Size Compatible with tested components up to 7 mm in size, ideal for small electronic parts and components.
This product is a versatile signal generator designed for high-performance testing, with a measurement frequency range spanning from 100 Hz to 100 kHz. When the Automatic Level Control (ALC) is enabled, the output voltage is adjustable between 0.1 and 1 Vrms (AC), providing precise control over signal amplitude. The maximum output current is 0.15 A, ensuring the ability to drive a wide variety of components and circuits during testing. The device features an output impedance of 10Ω when both the ALC and BOX are enabled, and a higher output impedance of either 25Ω or 100Ω when the ALC and BOX are disabled, allowing for flexible impedance matching based on specific testing requirements. It is designed to accommodate tested components with a maximum size of 7 mm, making it suitable for small electronic parts and components. This combination of features ensures accurate, reliable, and adaptable performance for a broad range of testing applications.
Specifications
When conducting high-capacitance MLCC capacitance measurements, it is common to encounter situations where the measured values do not match the nominal capacitance specified in the product datasheet.
Here are the correct measured capacitance values (C) and dissipation factors (D) provided
Due to the use of high dielectric constant insulating materials in MLCCs, they exhibit non-linear behavior in the low voltage range. This non-linearity causes the measured capacitance to vary with different applied voltages. The regulation (JIS C 5101-1-1998) specifies standards for the test signal.
For measuring MLCC capacitance, we typically use an LCR meter. However, LCR meters often experience voltage division due to the influence of current-limiting resistors when generating the output voltage signal. This can result in discrepancies between the measured values and the nominal capacitance stated in the product specification.
The circuit added in the test circuitry to stabilize the voltage level automatically corrects the offset voltage back to the user-set voltage signal value, enabling precise measurement of MLCC (Class 2) components of this kind.
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| Option Automatic Level Compensation Fixture (FX-LR0001) |   |
| Option SMD component testing fixture (FX-000C12) | Â  |
Taking a practical example of a 10uF MLCC (Class 2) component
 The measured capacitance value of 7.8uF (lower than the standard value) when AC level mode is not supported.
Use of FX-LR0001, which supports AC level compensation.
After applying AC level compensation, the measured capacitance value is closer to the standard value of 10uF.
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FX-LR0001 Automatic Level Compensation Fixture
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