GX5055 Specifications
Timing | |
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Internal Test Clock | 5 Hz to 50 MHz |
Internal Test Clock Timebase | PXI 10 MHz clock |
Test Clock Frequency Resolution | 1 Hz or 0.01% of the programmed test clock frequency (whichever is greater) |
Programmable Data Sense Strobe | 0 to 63.75 ns, relative to the drive clock edge (0 ns delay setting) |
Channel I/O | |
(All specifications based on pin electronic voltage rails (VCCÂ & VEE) of +18 V and -14 V) | |
Number of I/O Channels | 32 per Card |
Channel Direction Control | Input or Output per step, per channel |
Number of Drive and Sense Voltage References | 32 Drive Hi / Drive Lo 32 Sense Hi / Sense Lo |
Drive Voltage Range | -14 V to +26 V, Drive Hi & Drive Lo, maximum swing is 25 V |
Drive Voltage Level Range | 0.5 VPPÂ (min) 25 VPPÂ (max) |
Drive Voltage Accuracy | ±25 mV, 25 VPP drive voltage range, open circuit load |
Drive Voltage Resolution | 16 bits |
Driver Leakage Current | ±25 nA max |
Output Impedance | 50 Ω, typical |
Drive Current | 200 mA per channel, 1.6 A per board (max) |
Short Circuit Protection | Programmable current level with automatic disable, per channel basis |
Slew Rate | 0.1 to 1 V/nS, adjustable |
Sense Voltage Range | -16 V to +22 V, Sense Hi & Sense Lo |
Sense Voltage Threshold Accuracy | ±25 mV, < 25 VPP sense voltage |
Pull-up, Pull-down Current Source / Sink | ±24 mA, programmable on a per channel basis V commutate: -14 V to +22 V, programmable on a per channel basis |
Resistive Load | Range: Hi-Z, 250 Ω, 1 KΩ, programmable on a per channel basis |
Memory | 512 Kb per channel |
Sequencer and Trigger Functions | |
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Commands | No Op, Set Reg, Jump, Loop, Call Subroutine, Return, Pause, Halt |
Triggering | Software generated trigger External Input trigger override |
Pause | Software generated pause External Input pause override Sequencer Pause command |
External Timming, Control and Status Signals | |
User Clock Output | Data clock, TTL compatible, programmable delay relative to drive clock, 0 – 63.75 ns Resolution: 250 ps Jitter: 40 ps RMS |
External Strobe Output | Sense data strobe, TTL compatible Programmable delay relative to internal system clock, 0 – 63.75 ns Resolution: 250 ps |
External Test Clock | 0 to 50 MHz, TTL compatible input |
Pause Input | External pause override, TTL compatible |
Trigger Input | External trigger override, TTL compatible |
Run Status Output | Run indicator status, TTL compatible |
VCC | +5 VDCÂ output |
Parametric Measurement Unit (PMU) | |
Number of PMUs | 32, one per channel |
Modes | Force voltage, measure current Force current, measure voltage |
Force Voltage Range | -10 V to +15 V |
Force Current Range | ±25 mA FS ±200 mA FS |
Accuracy | 0.1% of FS Range |
Measure Voltage Range | -10 V to +15 V |
Measure Current Range | ±25 mA FS ±200 mA FS |
Accuracy | 0.1% of FS Range |
Environmental | |
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Operating Temperature | 0 °C to +50 °C |
Storage Temperature | -20 °C to +70 °C |
Vibration | 5 g @ 500 Hz |
Shock | 10 g for 6 ms ½ sine |
Physical Dimensions | |
Size | 6U PXI, single slot |
Weight | 1.2 lbs (520 g) |
Connections | |
External Control & Status | 9 position sub-D, female |
I/O Module | 68 position SCSI III Type |
External VCCÂ / VEE | 15 position sub-D, male +18 V @ 6 A -14 V @ 6 A |
Calibration | |
Calibration Interval | 1 year |
Note: Specifications are subject to change without notice.